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Electron microscopy

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Scanning electron microscope TESCAN Véga 2 XMU->doc576 Low vacuum, with EDAX PEGASUS combining X-ray microanalysis (EDS) and electron back-scattered diffraction (EBSD). Special holders designed for thin sections and polished blocks

Scanning-transmission electron microscope PHILIPS CM12 TEM/STEM (shared between two laboratories) with GATAN 636-DH double tilt liquid N2 cooled specimen holder

High resolution ZYGO NewView 7300 optical interferometer

Optical microscopes

Two polarizing microscopes: LEITZ Orthoplan (transmission light only); LEITZ Ortholux II POL-BK (transmission + reflected light)

One stereo microscope WILD M8 (polarizing stand, bright field/dark field illumination; annular ring light SCHOTT KL1500LCD + gooseneck light guide 2-branch DOLAN-JENNER MI-150 fibre optic light sources). All of these microscopes can be fitted with a NIKON D7000 digital camera.

One stereo microscope BAUSCH&LOMB StereoZoom 4 (transmitted light + gooseneck light guide 2-branch DOLAN-JENNER MI-150 fibre optic light source).

Sample preparation

Low temperature epoxy resin embedding capacity

BUEHLER Isomet 1000 high speed (100-950 rpm) precision saw (low speed precision saw also available in the laboratory)

BUEHLER Beta Vector grinder-polisher with automatic power head

REICHERT OMU 3 ultramicrotome

Temperature-controlled oven, magnetic/heating agitator, micro-drill, and an agate mortar complete the equipment.

Coating device

High vacuum Carbone coater BALZERS MED 010 Turbo

High resolution sputter coater CRESSINGTON 208HR: Platinum target, rotary-planetary-tilting stage, sample holders and thickness monitor

Skills and competences

Chemical and textural analysis on rock chips and thin sections
Quantitative chemical analyses on thin sections

EBSD orientation of minerals performed on polished surface or on rough crystals


Détermination par EBSD d’orientations cristallines réalisées sur surfaces polies ou minéraux bruts.

surface d’olivine brute cliché EBSD associé figure de pôle, orientation 010

Contrôle par interférométrie de la rugosité de surfaces cristallines avant/après polissage et avant/après expériences de lessivage (D. Daval)

Analyse morphologique et chimique des populations d’argiles (après extraction de la fraction fine). Corrélation avec les analyses RX

Crystal surface roughness assessment before/after polishing and before/after fluid/rock interaction experiments (see D. Daval)

Chemical analysis of clay minerals (see X-ray facility)

some details here

Technical staff

Gilles Morvan, ingénieur d’études Contact